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authorGuenter Roeck <linux@roeck-us.net>2024-07-24 09:42:16 -0700
committerGuenter Roeck <linux@roeck-us.net>2024-08-30 08:34:23 -0700
commitab7fbee452beca56b7c570d49190e679863362d5 (patch)
tree2655feac450eab071f410464a3e1c913229908a6 /tools/testing/selftests/bpf/prog_tests/autoload.c
parentbb25cdc2bff408ee3be1f20bd2cee4ea8b79c2d6 (diff)
hwmon: (ina2xx) Fix various overflow issues
Module tests show various overflow problems when writing limits and other attributes. in0_crit: Suspected overflow: [max=82, read 0, written 2147483648] in0_lcrit: Suspected overflow: [max=82, read 0, written 2147483648] in1_crit: Suspected overflow: [max=40959, read 0, written 2147483647] in1_lcrit: Suspected overflow: [max=40959, read 0, written 2147483647] power1_crit: Suspected overflow: [max=134218750, read 0, written 2147483648] update_interval: Suspected overflow: [max=2253, read 2, written 2147483647] Implement missing clamping on attribute write operations to avoid those problems. While at it, check in the probe function if the shunt resistor value passed from devicetree is valid, and bail out if it isn't. Also limit mutex use to the code calling ina2xx_set_shunt() since it isn't needed when called from the probe function. Reviewed-by: Tzung-Bi Shih <tzungbi@kernel.org> Signed-off-by: Guenter Roeck <linux@roeck-us.net>
Diffstat (limited to 'tools/testing/selftests/bpf/prog_tests/autoload.c')
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